X-RAY BOTH FEET LATERAL

This examination is commonly performed to evaluate foot pain, heel pain, trauma, suspected fractures, stress fractures, arthritis, foot deformities, bone infections, bone lesions, degenerative changes, and other disorders affecting one or both feet.

The examination evaluates the calcaneus (heel bone), talus, tarsal bones, metatarsals, phalanges (toe bones), foot arches, foot joints, and surrounding bony structures.

Yes. This examination is commonly used to identify fractures of the calcaneus, talus, metatarsals, tarsal bones, phalanges, and other bones of the feet. It also helps evaluate bone alignment following injury.

Yes. The lateral view is particularly useful for identifying plantar and posterior calcaneal (heel) spurs, which may contribute to heel pain.

Yes. It can identify flat feet (pes planus), high arches (pes cavus), congenital abnormalities, alignment changes, and other structural deformities affecting the feet.