X-Ray Both Heel Lateral is a side-view radiographic examination of both heels. It helps evaluate heel pain, calcaneal fractures, heel spurs, bone alignment, degenerative changes, and other abnormalities affecting the heel bones and surrounding joints.
Disclaimer: Result availability is subject to the laboratory's schedule and test availability.
X-Ray Both Heel Lateral is a side-view (Lateral) X-ray examination of both heels that uses low-dose X-ray radiation to evaluate the heel bones, joints, and surrounding bony structures.
This examination is commonly performed to evaluate heel pain, trauma, suspected fractures, heel spurs, plantar fasciitis, calcaneal fractures, bone infections, degenerative changes, and other disorders affecting one or both heels.
The Lateral view provides detailed images of the calcaneus (heel bone), talus, subtalar joint, Achilles tendon insertion, plantar surface of the heel, and surrounding bony structures. It is particularly useful for assessing heel spurs, fractures, and bone alignment.
The examination evaluates the calcaneus (heel bone), talus, subtalar joint, Achilles tendon insertion, plantar aspect of the heel, and surrounding bony structures.
Yes. It is commonly used to identify plantar and posterior calcaneal (heel) spurs, helping doctors determine whether they may be contributing to heel pain.
The examination is painless. However, positioning the foot may cause temporary discomfort if you have a recent heel injury or severe pain.